Physico Chemical and Electrical Investigations on Cobalt Enriched Spinel Phased Copper Cobaltite Thin Films
Volume
2, No.3
Pages:
376-383
Year of Publication:
October,2016
Journal of Applied Science and Engineering Methodologies
ISSN:
2347-8586
| Citation: S. Grace Victoriaa, A. Moses Ezhil Raj."Physico Chemical and Electrical Investigations on Cobalt Enriched Spinel Phased Copper Cobaltite Thin Films" Journal of Applied Science and Engineering Methodologies,Vol.2,No.3(2016):371-375.
BibTex
@article{23376383, author = {S.Grace Victoriaa, A. Moses Ezhil Raj}, title = {Physico Chemical and Electrical Investigations on Cobalt Enriched Spinel Phased Copper Cobaltite Thin Films}, journal = {Journal of Applied Science and Engineering Methodologies}, volume = {2}, number = {3}, month = {Oct}, year = {2016}, issn = {2395–5341}, url = {http://www.jasem.in/2016/23376383.html}, publisher = {Scientist Link Group of Publications}, address = {Chennai, India} } |
| DOI: | Full Text Download |
Abstract:
As the ternary oxides of copper cobalt have garnered much attention and have been studied for a wide range of applications, a venture has been carried out in preparing such a compound in thin film form. Spray pyrolysis deposition is undertaken at three different deposition temperatures viz. 250, 300 and 350 ℃. From the X- ray diffractograms of copper cobalt oxide films, it was clear that the film was crystalline only at the deposition temperature of 300 ºC and that copper has entered into the lattice only as a dopant as evident from the spinel type cobalt enriched phase (Cu0.3Co0.7) Co2O4. XPS studies pinpointed the presence of Cu2+ ions and revealed the occurrence of low spin Co3+ ions in the octahedral sites and high spin Co2+ ions in the tetrahedral oxygen environment. The films were found to have excellent conductivity induced by polaron hopping mechanism. The mixed oxidation states of the cations placed in the octahedral sites are the main contributing factor in the enhancement of electrical conductivity. Film thickness played a key role in determining the electrical properties.
Keywords: Thin films, X-ray diffraction, XPS, Electrical
As the ternary oxides of copper cobalt have garnered much attention and have been studied for a wide range of applications, a venture has been carried out in preparing such a compound in thin film form. Spray pyrolysis deposition is undertaken at three different deposition temperatures viz. 250, 300 and 350 ℃. From the X- ray diffractograms of copper cobalt oxide films, it was clear that the film was crystalline only at the deposition temperature of 300 ºC and that copper has entered into the lattice only as a dopant as evident from the spinel type cobalt enriched phase (Cu0.3Co0.7) Co2O4. XPS studies pinpointed the presence of Cu2+ ions and revealed the occurrence of low spin Co3+ ions in the octahedral sites and high spin Co2+ ions in the tetrahedral oxygen environment. The films were found to have excellent conductivity induced by polaron hopping mechanism. The mixed oxidation states of the cations placed in the octahedral sites are the main contributing factor in the enhancement of electrical conductivity. Film thickness played a key role in determining the electrical properties.
Keywords: Thin films, X-ray diffraction, XPS, Electrical
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